Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

Importancia y uso:

5.1 As AFM measurement technology has matured and proliferated, the technique has been widely adopted by the nanotechnology research and development community to the extent that it is now considered an indispensible tool for visualizing and quantifying structures on the nanoscale. Whether used as a stand-alone method or to complement other dimensional measurement methods, AFM is now a firmly established component of the nanoparticle measurement tool box. International standards for AFM-based determination of nanoparticle size are nonexistent as of the drafting of this guide. Therefore, this standard aims to provide practical and metrological guidance for the application of AFM to measure the size of substrate-supported nanoparticles based on maximum displacement as the probe is rastered across the particle surface to create a line profile.

Subcomité:

E56.02

Volúmen:

14.02

Número ICS:

07.120 (Nanotechnologies)

Palabras clave:

atomic force microscope; AFM; calibration; cantilever deflection; contact mode; functionalized substrate; gold nanoparticle; height displacement; intermittent mode; nanoparticle; nanoscale measurement; particle deposition; particle size; tapping mode;