Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

Importancia y uso:

5.1 Electronic circuits used in space, military, and nuclear power systems may be exposed to various levels of ionizing radiation. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure of nonvulnerability) of components to be used in such systems.

5.2 Some manufacturers currently are selling semiconductor parts with guaranteed hardness ratings. Use of this guide provides a basis for standardized qualification and acceptance testing.

Subcomité:

E10.07

Referida por:

F1190-24

Volúmen:

12.02

Número ICS:

31.080.01 (Semi-conductor devices in general)

Palabras clave:

ASIC (application specific integrated circuit); bipolar; cobalt 60 testing; ELDRS (enhanced low dose rate sensitivity); gamma ray tests; ionizing radiation testing; MOS; radiation hardness; semiconductor devices; time dependent effects; total dose testing; X-ray testing;