Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

Importancia y uso:

4.1 Illustrations provided in this guide are intended for use as references to aid in interpreting film or nonfilm images resulting from x-ray examinations (see Table 1) to ascertain quality of assembly and workmanship.

4.2 Required attributes of the design features or other construction details are not provided but are to be established as mutually agreed upon by manufacturers and users of these devices. Many devices share common assembly features; thus, these interpretations can be used for components not illustrated.

Subcomité:

E07.02

Referida por:

E1161-21, E0543-21, E0543-21

Volúmen:

03.03

Número ICS:

31.080.01 (Semi-conductor devices in general)

Palabras clave:

electronic devices; nondestructive testing; radiographs; radiography; reference illustrations; semiconductors; x-ray;