Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

Importancia y uso:

4.1 This practice establishes the basic minimum parameters and controls for the application of radiographic examination of electronic devices. Factors such as device handling, equipment, ESDS, materials, personnel qualification, procedure and quality requirements, reporting, records and radiation sensitivity are addressed. This practice is written so it can be specified on the engineering drawing, specification, or contract. It is not a detailed how-to procedure and must be supplemented by a detailed examination technique/procedure (see 10.1).

4.2 This practice does not set limits on radiation dose but does list requirements to limit and document radiation dose to devices. When radiation dose limits are an issue, the requestor of radiographic examinations must be cognizant of this issue and state any maximum radiation dose limitations that are required in the contractual agreement between the using parties.

Subcomité:

E07.01

Referida por:

E0431-96R22, E2033_E2033M-24, E1255-23

Volúmen:

03.03

Número ICS:

31.080.01 (Semi-conductor devices in general)

Palabras clave:

capacitor; diode; electronic device; hybrid; inductor; microcircuits; microcircuit array; monolithic; multichip; nondestructive testing; radiographic; radiologic; radiology; radioscopy; rectifier; relay; resistor; semiconductor; switches; transformer; transistor; tunnel diode; voltage regulator; X-ray;