Standard Guide for Specimen Preparation and Mounting in Surface Analysis

Importancia y uso:

4.1 Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable data. Specimens should be handled carefully so as to avoid the introduction of spurious contaminants in the preparation and mounting process. The goal must be to preserve the state of the surface so that the analysis remains representative of the original.

4.2 AES, XPS or ESCA, and SIMS are sensitive to surface layers that are typically a few nanometres thick. Such thin layers can be subject to severe perturbations caused by specimen handling (1)4 or surface treatments that may be necessary prior to introduction into the analytical chamber. In addition, specimen mounting techniques have the potential to affect the intended analysis.

4.3 This guide describes methods that the surface analyst may need to minimize the effects of specimen preparation when using any surface-sensitive analytical technique. Also described are methods to mount specimens so as to ensure that the desired information is not compromised.

4.4 Guide E1829 describes the handling of surface sensitive specimens and, as such, complements this guide.

Subcomité:

E42.03

Referida por:

E0996-19, F2847-17, E1829-14R20, E2735-14R20, F2150-19, E2108-16

Volúmen:

03.06

Número ICS:

71.040.50 (Physicochemical methods of analysis)

Palabras clave:

Auger electron spectroscopy; secondary ion mass spectroscopy; specimen mounting; specimen preparation; specimen treatment; surface analysis; X-ray photoelectron spectroscopy;