Standard Specification for Uniform Test Methods and Frequency

Subcomité:

B01.02

Referida por:

B0263_B0263M-14R20, B0836-00R21, B0609_B0609M-12R21, B0800-05R21, B0324-01R21, B0941-24, B0230_B0230M-22, B0233-97R21, B0398_B0398M-22, B0976-21

Volúmen:

02.03

Número ICS:

19.020 (Test conditions and procedures in general)

Palabras clave:

acceptable quality level (AQL); average outgoing quality (AOQ); control chart; lot; lower specification limit (LSL); process average; process control ratio (CPK); skip-lot inspection; statistical process control (SPC); upper specification limit (USL);